Weitere Bibliographie
1. Optical properties of solids, Mark Fox, Oxford University Press (2001).
2. Optical characterization of semiconductors: infrared, Raman, and photoluminescence spectroscopy, Sidney Perkowitz, Academic Press (1993).
3. Fundamentals of Semiconductors (Physics and Materials Properties) Peter Y. Yu and Manuel Cardona, 4th Edition, Ch. 3, 6, 7, Springer Verlag, 2010
4. Fundamentals of crystallography C. Giacovazzo et al IUCR Oxford University Press 1992
ents of X-Ray Diffraction
5.B.D. Cullity & S.R. Stock
Prentice Hall, Upper Saddle River (2001)
6.X-Ray Diffraction: A Practical Approach
C. Suryanarayana & M. Grant NortonPlenum Press, New York (1998)