Crystallography and Applications

Course Information
TitleΚΡΥΣΤΑΛΛΟΔΟΜΗ ΚΑΙ ΕΦΑΡΜΟΓΕΣ / Crystallography and Applications
CodeΣΥΕ204
FacultySciences
SchoolPhysics
Cycle / Level1st / Undergraduate
Teaching PeriodWinter
CoordinatorGeorgios Vourlias
CommonNo
StatusActive
Course ID40003028

Programme of Study: UPS of School of Physics (2012-today)

Registered students: 0
OrientationAttendance TypeSemesterYearECTS
CoreSpecial Election744

Class Information
Academic Year2017 – 2018
Class PeriodWinter
Faculty Instructors
Weekly Hours3
Class ID
600100167
Type of the Course
  • Background
  • General Knowledge
Mode of Delivery
  • Face to face
Digital Course Content
Language of Instruction
  • Greek (Instruction, Examination)
Prerequisites
Required Courses
  • ΓΘΥ205 Physics V (Modern Physics)
  • ΣΥΥ501 Structure of Materials Laboratory
  • ΣΥΕ204 Crystallography and Applications
Learning Outcomes
After successfully completing the course students are familiarized with basic principles of crystallography and physics of materials.
General Competences
  • Apply knowledge in practice
  • Retrieve, analyse and synthesise data and information, with the use of necessary technologies
  • Work autonomously
Course Content (Syllabus)
Introduction, Symmetry in direct and inverse space, Crystal systems, Indices de Miller, inverse space, Equation Bragg, Sphere Ewald. Single crystal X-ray structure study. Methods Laue, rotating crystal method, Weissenberg, transition, indexing, identification of crystalline constants. Crystalline powder X-ray structure study. Methods Debye - Sherrer, Guinier. Automatic powder diffractometer. Method Bragg - Brendano. Data processing, phase separation, Indexing, Identification of crystalline constants. Characterisation of materials, databases, applications. Analysis of profile of powder diagram and determination of the crystalline structure. Method Rietveld. Automatic four-circle single crystal diffractometer. Collection, data processing, statistical Wilson. Structure factors, electron density. Methods to determine the single crystal structure (indirect test directly). Functions Fourier, Patterson in structure determination. Improvement of the structure parameters. Geometry of the crystal cell.
Keywords
rystallography, X-ray methods, X-ray Diffraction, crystal structure, Production of x-rays
Educational Material Types
  • Notes
  • Slide presentations
Course Organization
ActivitiesWorkloadECTSIndividualTeamworkErasmus
Lectures872.9
Written assigments301
Exams30.1
Total1204
Student Assessment
Student Assessment methods
  • Written Assignment (Formative)
  • Oral Exams (Formative)
Bibliography
Course Bibliography (Eudoxus)
Σημειώσεις
Additional bibliography for study
Elements of X-Ray Diffraction B.D. Cullity & S.R. Stock Prentice Hall, Upper Saddle River (2001) X-Ray Diffraction: A Practical Approach C. Suryanarayana & M. Grant Norton Plenum Press, New York (1998)
Last Update
24-06-2016