Crystallography and Applications
| Title | ΚΡΥΣΤΑΛΛΟΔΟΜΗ ΚΑΙ ΕΦΑΡΜΟΓΕΣ / Crystallography and Applications |
| Code | ΣΥΕ204 |
| Faculty | Sciences |
| School | Physics |
| Cycle / Level | 1st / Undergraduate |
| Teaching Period | Winter |
| Coordinator | Georgios Vourlias |
| Common | No |
| Status | Active |
| Course ID | 40003028 |
| Academic Year | 2018 – 2019 |
| Class Period | Winter |
| Faculty Instructors |
|
| Weekly Hours | 3 |
| Class ID | 600132676
|
Course Type 2016-2020
- Background
- General Knowledge
Course Type 2011-2015
General Foundation
Mode of Delivery
- Face to face
Digital Course Content
- e-Study Guide https://qa.auth.gr/en/class/1/600132676
Language of Instruction
- Greek (Instruction, Examination)
Prerequisites
Required Courses
- ΓΘΥ205 Physics V (Modern Physics)
- ΣΥΥ501 Structure of Materials Laboratory
- ΣΥΕ204 Crystallography and Applications
Learning Outcomes
After successfully completing the course students are familiarized with basic principles of crystallography and physics of materials.
General Competences
- Apply knowledge in practice
- Retrieve, analyse and synthesise data and information, with the use of necessary technologies
- Work autonomously
Course Content (Syllabus)
Introduction, Symmetry in direct and inverse space, Crystal systems, Indices de Miller, inverse space, Equation Bragg, Sphere Ewald. Single crystal X-ray structure study. Methods Laue, rotating crystal method, Weissenberg, transition, indexing, identification of crystalline constants. Crystalline powder X-ray structure study. Methods Debye - Sherrer, Guinier. Automatic powder diffractometer. Method Bragg - Brendano. Data processing, phase separation, Indexing, Identification of crystalline constants. Characterisation of materials, databases, applications. Analysis of profile of powder diagram and determination of the crystalline structure. Method Rietveld. Automatic four-circle single crystal diffractometer. Collection, data processing, statistical Wilson. Structure factors, electron density. Methods to determine the single crystal structure (indirect test directly). Functions Fourier, Patterson in structure determination. Improvement of the structure parameters. Geometry of the crystal cell.
Keywords
rystallography, X-ray methods, X-ray Diffraction, crystal structure, Production of x-rays
Educational Material Types
- Notes
- Slide presentations
Course Organization
| Activities | Workload | ECTS | Individual | Teamwork | Erasmus |
|---|---|---|---|---|---|
| Lectures | 87 | ✓ | |||
| Written assigments | 30 | ✓ | |||
| Exams | 3 | ||||
| Total | 120 |
Student Assessment
Student Assessment methods
- Written Assignment (Formative)
- Oral Exams (Formative)
Bibliography
Course Bibliography (Eudoxus)
Σημειώσεις
Additional bibliography for study
Elements of X-Ray Diffraction
B.D. Cullity & S.R. Stock
Prentice Hall, Upper Saddle River (2001)
X-Ray Diffraction: A Practical Approach
C. Suryanarayana & M. Grant Norton
Plenum Press, New York (1998)
Last Update
24-06-2016
