Learning Outcomes
On completion of this module a student should be able to:
1. Fully understand the connection between the properties of materials and crystals and their structure, thus recognize the application range of each material.
2. Identify the structure and characteristics of the matter using X-rays characterization.
3. To use specific crystallography softwares to characterize the materials and solve issues related to their identification.
4. Understand the structural characteristics of a wide range of materials such as coatings, thin films, thermoelectrics, polymers, etc which are currently used in several advanced technological fields.
5. Realize the connection between the Physics of Crystals to other scientific fields such as Chemistry, Mineralogy, Metallurgy, Materials Science, etc.
Course Content (Syllabus)
Introduction, Symmetry in direct and inverse space, Crystal systems, Indices de Miller, inverse space, Equation Bragg, Sphere Ewald. Single crystal X-ray structure study. Methods Laue, rotating crystal method, Weissenberg, transition, indexing, identification of crystalline constants. Crystalline powder X-ray structure study. Methods Debye - Sherrer, Guinier. Automatic powder diffractometer. Method Bragg - Brendano. Data processing, phase separation, Indexing, Identification of crystalline constants. Characterisation of materials, databases, applications. Analysis of profile of powder diagram and determination of the crystalline structure. Method Rietveld. Automatic four-circle single crystal diffractometer. Collection, data processing, statistical Wilson. Structure factors, electron density. Methods to determine the single crystal structure (indirect test directly). Functions Fourier, Patterson in structure determination. Improvement of the structure parameters. Geometry of the crystal cell.
Keywords
rystallography, X-ray methods, X-ray Diffraction, crystal structure, Production of x-rays