Facolta’ | |
Dipartimento | |
Qualification Awarded | Physics and Technology of Materials |
Programma di Studio | PMS Fysikī & Technología Ylikṓn (2014-2018) |
Ciclo / Livello di Studi | 2. Post Laurea |
Anno Accademico | 2017 - 2018 |
Stato | Inactive |
Website | http://pms.physics.auth.g |
Contact email | pms@physics.auth.gr |
ECTS / Workload | One ECTS unit corresponds to 30 hours of workload. |
Codice | Titolo | ECTS | Tipo |
---|---|---|---|
ΜΦΥ652 | PHYSICAL PROPERTIES OF MATERIALS | 8 | O |
ΜΦΥ653 | MATERIALS STRUCTURE, GROWTH AND SYNTHESIS | 8 | O |
ΜΦΥ663 | MATERIALS CHARACTERIZATION TECHNIQUES | 8 | O |
ΜΦΥ664 | SOLID STATE PHYSICS | 2 | O |
ΜΦΥ666 | MATERIALS CHARACTERIZATION LABORATORY I | 2 | O |
Codice | Titolo | ECTS | Tipo |
---|---|---|---|
ΜΦΥ655 | MATERIALS OPTIMIZATION AND SELECTION METHODS | 8 | O |
ΜΦΥ657 | INDUSTRIAL MATERIALS | 8 | O |
ΜΦΥ660 | TRAINING IN RESEARCH METHODOLOGY | 2 | O |
ΜΦΥ764 | PHYSICS AND TECHNOLOGY OF OPTOELECTRONIC MATERIALS AND DEVICES | 2 | FsL |
ΜΦΥ767 | SIMULATION METHODS IN MATERIALS PHYSICS | 2 | FsL |
ΜΦΥ768 | ADVANCED MATERIALS IN RENEWABLE ENERGY TECHNOLOGIES | 2 | FsL |
ΜΦΥ771 | MATERIALS CHARACTERIZATION IN LARGE SCALE NEUTRON AND SYNCHROTRON X-RAY FACILITIES | 2 | FsL |
ΜΦΥ773 | METROLOGY AND METHODS FOR THE DETERMINATION OF PHYSICAL QUANTITIES | 2 | FsL |
ΜΦΥ774 | PRINCIPLES OF INTELLECTUAL PROPERTY AND TECHNOLOGY MANAGEMENT | 2 | FsL |
ΜΦΥ775 | TOPICS IN MATERIALS CHARACTERIZATION | 2 | FsL |
ΜΦΥ778 | MAGNETIC NANOSTRUCTURES | 2 | FsL |
ΜΦΥ779 | COLLOIDS AND POLYMERS | 2 | FsL |
ΜΦΥ780 | TOPICS IN CHARACTERIZATION, CONSERVATION AND RESTORATION IN CULTURAL HERITAGE | 2 | FsL |
ΜΦΥ781 | MATERIALS CHARACTERIZATION LABORATORY II | 4 | O |
ΜΦΥ782 | THIN FILMS TECHNOLOGY AND APPLICATIONS | 2 | FsL |
ΜΦΥ783 | INTERNSHIP | 2 | FsL |
Codice | Titolo | ECTS | Tipo |
---|---|---|---|
ΜΦΥ716 | MASTER THESIS | 30 | DIP |
Codice | Titolo | ECTS | Tipo |
---|---|---|---|
ΜΦΥ665 | SEMINARS | 2 | O |