Course Content (Syllabus)
Scattering, diffraction and absorption of radiation (e.g. synchrotron X-rays and neutrons) with matter are fundamental characterization tools in materials science. A considerable number of advanced characterization techniques are based on these mechanisms providing precise information on the crystalline structure, magnetic properties, lattice dynamics, and composition as well as on the bonding environment and spatial distribution of elements in various types of materials. In the beginning, the basic properties and production of synchrotron radiation and neutrons as well as the fundamental mechanisms of their interaction with matter (absorption, scattering, diffraction, and reflection) will be discussed. Then, an overview of synchrotron and neutron characterization techniques will be presented, with main emphasis in X-ray absorption, fluorescence and photoelectron spectroscopies as well as in X-ray neutron scattering. Various examples on the application of these techniques for the study of solids, surfaces, thin films, catalysis etc. will be presented. Finally, a short description of Large Scale Facilities worldwide (installations & perspectives) will be provided.
Course Bibliography (Eudoxus)
- Σημειώσεις & Διαφάνειες, Μ. Κατσικίνη
- N. W. Ashcroft and N. D. Mermin: "Solid State Physics" Saunders College Publishing (1976).
- L. H. Schwartz, J. B. Cohen: "Diffraction From Materials" Springer-Verlag (1987). "Neutron and Synchrotron Radiation for Condensed Matter Studies" High European Research Course for Users of Large Experimental Systems, volumes 1, 2, 3. Springer-Verlag (1993).
- "Synchrotron Radiation Crystallography" Ph. Coppens, D. E. Cox, Academic Press 1992.
- “EXAFS : Basic principles & data analysis" B. K. Teo, Springer-Verlag (1986).
- "NEXAFS spectroscopy" J. Stoehr, Springer-Verlag (1996).
- "X-ray absorption" D. C. Koningsberger & R. Prins, John Wiley & Sons (1988).
- Προγράμματα Ανάλυσης Δεδομένων