Advanced Methods of Transmission Electron Microscopy and Nanoanalysis

Course Information
TitleΠροηγμένες Μέθοδοι Ηλεκτρονικής Μικροσκοπίας Διέλευσης και Νανοανάλυσης / Advanced Methods of Transmission Electron Microscopy and Nanoanalysis
CodeΠΥΕ212
FacultySciences
SchoolPhysics
Cycle / Level2nd / Postgraduate
Teaching PeriodWinter/Spring
CommonNo
StatusActive
Course ID600023530

Programme of Study: PMS PROĪGMENA LEITOURGIKA YLIKA

Registered students: 0
OrientationAttendance TypeSemesterYearECTS
KORMOSElective Courses214
Class Information
Academic Year2023 – 2024
Class PeriodSpring
Faculty Instructors
Class ID
600247253
Course Type 2021
Specialization / Direction
Mode of Delivery
  • Face to face
Digital Course Content
Language of Instruction
  • Greek (Instruction, Examination)
Prerequisites
General Prerequisites
General background in Materials Science and Technology with respect to material types, properties and tecnhiques
Learning Outcomes
Upon successful completion, students will -have a comprehensive knowledge of the topics studied by Transit Electron Microscopy -be able to study and interpret the features that appear at the nanoscale and are observed with electron microscopy techniques.
General Competences
  • Apply knowledge in practice
  • Retrieve, analyse and synthesise data and information, with the use of necessary technologies
  • Make decisions
  • Work autonomously
  • Generate new research ideas
Course Content (Syllabus)
Course is offered only upon students’ interest. The course begins by establishing a historical context and elucidating the fundamental principles of electron microscopy, offering a comparative overview with other microscopy techniques. Subsequently, students explore the components of a Transmission Electron Microscope, gaining insights into electron sources, lenses, detectors, and imaging systems. A significant portion of the course is dedicated to the diverse techniques and modes employed in TEM, including bright-field and dark-field imaging, high-resolution TEM, and electron diffraction. Practical aspects of sample preparation, such as fixation, embedding, and staining, are covered in detail, along with contemporary techniques like cryo-TEM and in-situ methodologies. The course concludes with an exploration of recent advances and future prospects in TEM and nanoanalysis, focusing on aberration correction, in-situ techniques, and emerging technologies.
Keywords
Transmission Electron Microscopy, Nanoanalysis
Educational Material Types
  • Notes
  • Slide presentations
  • Multimedia
  • Book
Use of Information and Communication Technologies
Use of ICT
  • Use of ICT in Course Teaching
  • Use of ICT in Communication with Students
  • Use of ICT in Student Assessment
Description
-Powepoint presentations, simulations and videos showing properties, phenomena observed and studied by Transmission Electron Microscopy and Nanoanalysis. -Electronic communication (email, elearning) -Quizzes, Exercises via elearning
Course Organization
ActivitiesWorkloadECTSIndividualTeamworkErasmus
Lectures261.0✓
Reading Assigment361.4✓
Project361.4✓
Exams20.1✓
Total1004
Student Assessment
Description
Written exam requiring critical thinking on properties, phenomena and applications of Transmission Electron Microscopy and Analysis
Student Assessment methods
  • Written Exam with Short Answer Questions (Summative)
  • Written Exam with Extended Answer Questions (Summative)
  • Written Assignment (Summative)
Bibliography
Course Bibliography (Eudoxus)
1. Correlative Light and Electron Microscopy IV, L. Wilson, 2019, HEAL-Link Elsevier ebooks, Εύδοξος:94623668, ISBN: 9780128170199
Additional bibliography for study
1. Transmission Electron Microscopy: A Textbook for Materials Science, D.B. Williams, C. B. Carter, 2013, Springer US, ISBN:9781475725193, 1475725191
Last Update
17-01-2024