Learning Outcomes
Upon successful completion, students
- will have a comprehensive theoretical knowledge of the elastoplastic mechanical behavior of advanced functional materials down to the nanoscale and of the methods for its experimental characterization. - will be able to describe crystal structure and symmetry, including point, line, and extended defects.
- will understand basic concepts of interface science pertinent to homophase and heterophase interfaces
- will have an overall understanding of the structural and mechanical properties of advanced nano-heterostructures and low-dimensional materials such as quantum dots and wells, superlattices, nanowires, nanoparticles.
Course Content (Syllabus)
The concepts of stress and strain, shear, 3D descriptions. Moduli of elastic behavior, energy of elastic deformation, thermal expansion, principal stresses/strains, inhomogeneous stress state, compatibility of strains. Stress-strain relation, anisotropic elastic behavior, generalized Hooke’s law. Plane stress and strain states. Plastic deformation, fracture, creep, fatigue, hardness. Experimental determination of mechanical properties.
Elements of crystal structure and symmetry. Point defects. Dislocations: topological characterization, motion for plasticity, dislocations in various structures, energy, forces between dislocations, multiplication mechanisms. Extended defects. Homophase and heterophase interfaces, twins, grain boundaries (large and small angle, tilt and twist boundaries, coincidence site lattice model, structural units model, motion, junctions). Heteroepitaxial interfaces, coherency, critical thickness of epilayers. Quantum wells and interlayers. Quantum dots. Superlattices. Nanowires. Other advanced nano-heterostructures. Elastoplastic behavior of nanostructures and its experimental determination.
Keywords
Crystal structure, Defects, Structural properties, Mechanical properties, Plasticity, Interfaces, Grain boundaries, Epilayers, Low-dimensional materials, Quantum wells, Quantum dots, Nanowires, Nanoparticles Characterization methods