Course Content (Syllabus)
Introduction, Symmetry in direct and inverse space, Crystal systems, Indices de Miller, inverse space, Equation Bragg, Sphere Ewald. Single crystal X-ray structure study. Methods Laue, rotating crystal method, Weissenberg, transition, indexing, identification of crystalline constants. Crystalline powder X-ray structure study. Methods Debye - Sherrer, Guinier. Automatic powder diffractometer. Method Bragg - Brendano. Data processing, phase separation, Indexing, Identification of crystalline constants. Characterisation of materials, databases, applications. Analysis of profile of powder diagram and determination of the crystalline structure. Method Rietveld. Automatic four-circle single crystal diffractometer. Collection, data processing, statistical Wilson. Structure factors, electron density. Methods to determine the single crystal structure (indirect test directly). Functions Fourier, Patterson in structure determination. Improvement of the structure parameters. Geometry of the crystal cell.