Electron Microscopy and X-ray Diffraction in Materials’ Science
| Title | Ηλεκτρονική Μικροσκοπία και Περίθλαση Ακτίνων-Χ στην Επιστήμη των Υλικών / Electron Microscopy and X-ray Diffraction in Materials’ Science |
| Code | ΠΥΥ106 |
| Faculty | Sciences |
| School | Physics |
| Cycle / Level | 2nd / Postgraduate |
| Teaching Period | Winter/Spring |
| Common | No |
| Status | Active |
| Course ID | 600023513 |
Programme of Study: PMS PROĪGMENA LEITOURGIKA YLIKA
Registered students: 0
| Orientation | Attendance Type | Semester | Year | ECTS |
|---|---|---|---|---|
| KORMOS | Compulsory Course | 1 | 1 | 5 |
| Academic Year | 2023 – 2024 |
| Class Period | Winter |
| Faculty Instructors | |
| Instructors from Other Categories | |
| Class ID | 600247236
|
Course Type 2021
Specific Foundation
Mode of Delivery
- Face to face
Digital Course Content
- e-Study Guide https://qa.auth.gr/en/class/1/600247236
- At the Website of the School: http://pms.physics.auth.gr/materials2024/lessons/ilektroniki-mikroskopia-kai-perithlasi-aktinon-ch-stin-epistimi-ton-ylikon/
- eLearning: https://elearning.auth.gr/course/view.php?id=18278
Language of Instruction
- Greek (Instruction, Examination)
Prerequisites
General Prerequisites
Basic knowledge of Crystal Structure, Solid State Physics and Materials Science
Learning Outcomes
Upon successful completion, students:
- be able to interpret at a primary level the structural features and properties of matter
- be able to distinguish different categories of materials according to their structural characteristics
- have a comprehensive knowledge of structural characterization techniques
General Competences
- Apply knowledge in practice
- Work autonomously
Course Content (Syllabus)
This course provides a comprehensive insight into the structural characterization of materials using X-ray diffraction, an effective non-destructive method, and advanced transmission electron microscopy (TEM), a destructive but the most powerful technique, giving access to structural and chemical information from the micrometer to the sub-angstrom scale. We will start with the crystalline and amorphous states of matter, the basic types of crystal structures, the symmetry in direct and reciprocal space, and the crystallographic directions and planes - generation and detection of X-rays, data collection, and processing - X-ray diffraction of single crystals, identification of unknown materials, phase identification, and improvement of crystalline structures. We will continue with a deep understanding of modern TEM and the connection between
the optics and operation of the instrument, the physics of electron-matter interactions, the basics of electron diffraction, and how it is represented by the Ewald sphere/reciprocal lattice construction. We will analyze electron diffraction patterns and consider the 2-beam diffraction contrast (kinematical and dynamical theory) and the phase contrast imaging by which the crystal lattice can be imaged with atomic resolution. In a thin, electron-transparent sample, we will consider how to determine the crystallinity, grain structure, size, morphology, defects, and chemical composition using state-of-the-art scanning/transmission electron microscopy (STEM), including dark field Z- contrast imaging and microanalysis by EDXS and EELS.
Keywords
crystal structure, electron microscopy, X-ray diffraction, structural properties
Educational Material Types
- Notes
- Slide presentations
- Multimedia
- Book
Use of Information and Communication Technologies
Use of ICT
- Use of ICT in Course Teaching
- Use of ICT in Communication with Students
- Use of ICT in Student Assessment
Description
-Powepoint presentations, simulations and videos showing properties, phenomena and technological applicability of magnetic materials.
-Electronic communication (email, elearning).
-Quizzes, Exercises via elearning.
Course Organization
| Activities | Workload | ECTS | Individual | Teamwork | Erasmus |
|---|---|---|---|---|---|
| Lectures | 26 | 1.0 | ✓ | ||
| Laboratory Work | 13 | 0.5 | ✓ | ||
| Reading Assigment | 36 | 1.4 | ✓ | ||
| Written assigments | 48 | 1.9 | ✓ | ||
| Exams | 2 | 0.1 | ✓ | ||
| Total | 125 | 5 |
Student Assessment
Description
Written examination that includes topics-questions that require critical thinking about the phenomena and properties related with the structure of materials.
Laboratory report with the processing of experimental results obtained during the laboratory.
Student Assessment methods
- Written Exam with Short Answer Questions (Summative)
- Written Exam with Extended Answer Questions (Summative)
- Labortatory Assignment (Summative)
Bibliography
Course Bibliography (Eudoxus)
1. Φυσική στερεάς κατάστασης, Hofmann P., 2020, Εκδόσεις Παπαζήση, Εύδοξος: 94700247, ISBN 9789600236781
2. Φυσική στερεάς κατάστασης, Ibach Harald, Luth Hans, 2011, Εκδόσεις ΖΗΤΗ, Εύδοξος: 12583778, ISBN: 9789604563135
Additional bibliography for study
1. ΟΠΤΙΚΗ ΚΑΙ ΗΛΕΚΤΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ, ΠΑΝΑΓΙΩΤΗΣ ΒΕΡΙΛΛΗΣ, 2015, ΠΑΝΕΠΙΣΤΗΜΙΑΚΕΣ ΕΚΔΟΣΕΙΣ ΘΕΣΣΑΛΙΑΣ, Εύδοξος:68393330, ISBN: 9789609439329.
2. Επιστήμη και τεχνολογία υλικών, S. Trolier-McKinstry, R.E.Newnham, 2021, Εκδόσεις Κριτική, Εύδοξος:102071585, ISBN:9789605863760
Last Update
14-01-2024
