Materials Characterization Methods
| Title | Μέθοδοι Χαρακτηρισμού Υλικών / Materials Characterization Methods |
| Code | Μ4Υ12 |
| Faculty | Sciences |
| School | Chemistry |
| Cycle / Level | 2nd / Postgraduate |
| Teaching Period | Winter |
| Common | No |
| Status | Active |
| Course ID | 600016628 |
Programme of Study: PMS "EPISTĪMĪ KAI TECΗNOLOGIA ĪLEKTROCΗĪMIKŌN SYSTĪMATŌN" (NEO)
Registered students: 0
| Orientation | Attendance Type | Semester | Year | ECTS |
|---|---|---|---|---|
| "Epistīmī kai Technología Īlektrochīmikṓn Systīmátōn" | Compulsory Course | 1 | 1 | 10 |
Programme of Study: Postgraduate Program "Electrochemical Systems Science and Technology"
Registered students: 7
| Orientation | Attendance Type | Semester | Year | ECTS |
|---|---|---|---|---|
| "Epistīmī kai Technología Īlektrochīmikṓn Systīmátōn" | Compulsory Course | 1 | 1 | 10 |
| Academic Year | 2025 – 2026 |
| Class Period | Winter |
| Faculty Instructors | |
| Weekly Hours | 4 |
| Class ID | 600282101
|
Course Type 2011-2015
Knowledge Deepening / Consolidation
Mode of Delivery
- Face to face
Digital Course Content
Learning Outcomes
- To understand the basic principles of the most widespread microscopic and spectroscopic techniques for the characterization of materials.
- To apply the techniques in electrochemical application system
General Competences
- Apply knowledge in practice
- Retrieve, analyse and synthesise data and information, with the use of necessary technologies
Course Content (Syllabus)
a) Microscopies: Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Scanning Electrochemical Microscopy (SECM), Scanning Electron Microscopy (SEM).
b) Spectroscopies: X-ray Photoelectron Spectroscopy (XPS). Auger Electron Spectroscopy (AES). Energy Dispersive Spectroscopy (EDS)
c) X-Ray Diffraction
d) Gas chromatography for material properties study
e) Demonstration of experimental techniques
Educational Material Types
- Notes
- Slide presentations
Use of Information and Communication Technologies
Description
a) Microscopies: Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Scanning Electrochemical Microscopy (SECM), Scanning Electron Microscopy (SEM).
b) Spectroscopies: X-ray Photoelectron Spectroscopy (XPS). Auger Electron Spectroscopy (AES). Energy Dispersive Spectroscopy (EDS)
c) X-Ray Diffraction
d) Gas chromatography for material properties study
e) Demonstration of experimental techniques
Course Organization
| Activities | Workload | ECTS | Individual | Teamwork | Erasmus |
|---|---|---|---|---|---|
| Lectures | |||||
| Exams | |||||
| Total |
Student Assessment
Student Assessment methods
- Written Exam with Extended Answer Questions (Formative, Summative)
Last Update
24-01-2024
